Notes
Slide Show
Outline
1
Long-Term Knowledge Retention
  • Joshua Lubell
  • Manufacturing Systems Integration Division, NIST


  • FIRM’s Forum at FOSE
  • March 20, 2007
2
The problem
  • Too much digital data!
    • It takes about 15 minutes for the world to churn out new digital information equivalent to the entire collection in US Library of Congress
  • Proprietary file formats
    • Expected lifetime of typical manufacturing software application only 3 years
  • Short-lived Computing hardware and software
    • Expected lifetime of today’s storage/retrieval technologies only 10 years
  • Products often outlive computer software/hardware by an order of magnitude
    • Aircraft can last 50 years or more
    • Healthcare records should be preserved through the patient’s lifetime, and perhaps beyond
3
Data standards
  • Necessary to avoid being locked into a vendor format or application that could disappear in the near future
  • Likely to be more stable than proprietary tools/formats
  • But data standards are only part of the solution
    • Information is more than just data!
4
Information = Data + Interpretation
5
An information package
6
Tools for tackling
LTKR
  • Standards for representing digital artifacts
    • STEP – ISO 10303 (product data)
    • XML (documents)
    • Graphics, audio, video, multimedia standards
    • Scientific modeling standards
  • Standards for representing preservation information
    • Ontology languages
    • Packaging standards (METS, XFDU)
  • Digital format registries (UK Archives, Harvard, Univ. of Maryland)


7
March 2006 LTKR workshop
  • Diverse group of 35 met at NIST
    • Industry, academia, government equally represented
  • Immediate goal: identify challenges, research, and implementation issues in digital preservation of information
    •  Emphasis on design and manufacturing
  • Next step: develop roadmap identifying areas of investigation and experimental testbeds for archival of design and manufacturing information
8
Observations
  • LTKR seen by many as a process
    • Apply archiving methodology (e.g. OAIS reference model) to collection of digital artifacts
    • “Repository-centric”
  • Alternative “document-centric” view
    • Preservation and authenticity paramount
    • Archival process and data representation secondary


9
More observations
  • Barriers to archiving
    • Lack of understanding, institutional support
    • Each scenario has its own unique requirements
    • Lack of formal methods and standards
      • Need a way to measure the quality of an archiving process
      • Library of Congress digital format sustainability criteria a good starting point
  • Recommendations
    • Create tools, methods for capturing business and manufacturing process workflows
    • Collect and preserve case studies of archiving successes and failures
    • Develop metrology for digital archiving
10
Upcoming workshop
  • Long Term Sustainment of Digital Information: Putting the Pieces Together
    • April 24-25, 2007 at NIST in Gaithersburg, Maryland
    • Part of Interoperability Week @ NIST
    • http://digitalpreservation.wikispaces.com/LTKR+2007+Call+for+participation
  • Questions we will attempt to answer
    • How can you predict the future effectiveness of a digital preservation solution?
    • What combination of technologies is optimal for achieving success at a reasonable cost?
  • Registration deadline: April 9


11
The time is now
  • Industry is feeling the pain
    • From a major aerospace company Vice President: Lack of archiving support could derail our efforts to move from a drawing-centric to a model-centric business model
    • Federal regulators recently fined Morgan Stanley $15M for failing to produce emails sought in investigations
  • Government recognizes the need
    • “Maintenance of and access to long-lived science and engineering data collections and Federal records” a funding priority according to Networking and Information Technology Research and Development (NITRD) supplement to the President’s FY2007 budget
  • The technologies we need are becoming increasingly available
12
Links/Contacts
  • Interoperability Week @ NIST
    • April 23-25, 2007
    • http://www.mel.nist.gov/div826/msid/sima/interopweek
  • March 2006 LTKR workshop
    • Report: http://www.nist.gov/msidlibrary/doc/NISTIR_7386.pdf
    • Website: http://edge.cs.drexel.edu/LTKR/
  • Me
    • Email: lubell@nist.gov
    • Phone: (301) 975-3563